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Eureka Express DDR4 2133Mhz
Eureka Express DDR4 2133Mhz
Eureka Express DDR4 2133Mhz The New "Eureka Express DDR4 DIMM" tester provides added troubleshoot capability for the present and future DDR4 memory modules at affordable prices. It is targeted for the DIMM manufacturers, computer OEM, computer integrators, memory distributors, and service depots. It is indeed the fastest tester and the easiest to use in its class. A desktop PC or Laptop is required for interfacing with the Eureka Express.
Description
High Performance System
- Auto ID:RDIMM, UDIMM
- Auto ID:Memory Configuration, Size
- Auto ID:Frequency, CAS Latency
- Detects:ECC and Non-ECC RDIMM
- Real Cycle Time Testing
- Super Fast Teat Time

Effective Test Algorithm
- Quick Checks for Assembly Faults
- Up to 27 Test Patterns for Functional Test
- Complete SPD Programming Tools
- Support Heat Chamber

Ease of Use
- Interfaces with Desktop via USB Port
- Window Driven Graphic System
- Pictorial Aid to Pinpoint Faulty Chip
- EZ Firmware Upgrade
- Supports All CST Auto-Handlers
- Supports Window XP, VISTA & Win7
Product Specifications
Technical Specifications (DDR4 Testing)
Clock Frequency:800, 933 & 1066 Mhz
Data Rate:1600,1866 &2133 Mhz

Address Depth:4 Gigawords Capacity up to 16 Row x 10 Col Data Width:Expandable to 72 Bits
Voltage:VDD 1.0 - 1.4, VPP 2.3 ? 2.7
CAS Latency:9, 10, 11, 12, 13, 14 & 15 Clock
tRCD & tRP:9, 10, 11, 12, 13, 14 & 15 Clock
Burst Length:4 Chop & 8
CWL:9, 10, 11 , 12, 14
Mirror-Mode:Auto
Dynamic ODT:Auto 34, 40, 48, 60 , 80, 120 & 240 ohm
ZQ Adjust:Auto Calibrate
Refresh Cycle:Auto / Self Refresh
DC Test Pattern:Walk Data, Address, CS, CKE, DQM, DQS Test
AC Test Pattern:Mat-S, March B, March X, March Y, March G, March U, Mov-I, Hammer Read Test
SPD Program:Write/Read 0 ? 511 SWP, CWP

General Specs
Power Requirement:110V - 230V AC
Operating Temp:-20 to 100 Degrees F
Humidity:20% to 80% ( Non-Condensing )
Dimension:235 x 220 x 140 mm ? 10 Pounds
Host Computer:Intel / AMD Based ( USB 2.0 & 3.0 )
Eureka Express DDR3
Eureka Express DDR3
Description
High Performance System :

Auto ID: RDIMM, UDIMM, SODIMM,
Auto ID:Memory Configuration, Size
Auto ID:Frenquency, Cas Latency
Detects:ECC and Non-ECC RDIMM
Real Cycle Time Testing
Super Fast Test Time
Effective Test Algorithum :

Quick checks for Assembly faults
Up to 27 Test Patterns for Functional test
Complete SPD Programming tools
Fault Focusing tools to detect bad chips
Support Heat Chamber

Ease of Use :
Interface with Desktop via USB port
Window driven graphic system
Pictorial aid to Pin-point faulty chip
EZ firmware upgrade
Support all CST Auto-Handler
Support Window XP, VISTA, WIN7
  • 採用情報
会社情報
本社
 〒190-0012
 東京都立川市曙町1-16-5
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