DDR4
DDR3
| Eureka Express DDR4 2133Mhz | |
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| Eureka Express DDR4 2133Mhz The New "Eureka Express DDR4 DIMM" tester provides added troubleshoot capability for the present and future DDR4 memory modules at affordable prices. It is targeted for the DIMM manufacturers, computer OEM, computer integrators, memory distributors, and service depots. It is indeed the fastest tester and the easiest to use in its class. A desktop PC or Laptop is required for interfacing with the Eureka Express. | |
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Description High Performance System - Auto ID：RDIMM, UDIMM - Auto ID：Memory Configuration, Size - Auto ID：Frequency, CAS Latency - Detects：ECC and Non-ECC RDIMM - Real Cycle Time Testing - Super Fast Teat Time Effective Test Algorithm - Quick Checks for Assembly Faults - Up to 27 Test Patterns for Functional Test - Complete SPD Programming Tools - Support Heat Chamber Ease of Use - Interfaces with Desktop via USB Port - Window Driven Graphic System - Pictorial Aid to Pinpoint Faulty Chip - EZ Firmware Upgrade - Supports All CST Auto-Handlers - Supports Window XP, VISTA & Win7 |
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Product Specifications Technical Specifications (DDR4 Testing) Clock Frequency：800, 933 & 1066 Mhz Data Rate：1600,1866 &2133 Mhz Address Depth：4 Gigawords Capacity up to 16 Row x 10 Col Data Width：Expandable to 72 Bits Voltage：VDD 1.0 - 1.4, VPP 2.3 ? 2.7 CAS Latency：9, 10, 11, 12, 13, 14 & 15 Clock tRCD & tRP：9, 10, 11, 12, 13, 14 & 15 Clock Burst Length：4 Chop & 8 CWL：9, 10, 11 , 12, 14 Mirror-Mode：Auto Dynamic ODT：Auto 34, 40, 48, 60 , 80, 120 & 240 ohm ZQ Adjust：Auto Calibrate Refresh Cycle：Auto / Self Refresh DC Test Pattern：Walk Data, Address, CS, CKE, DQM, DQS Test AC Test Pattern：Mat-S, March B, March X, March Y, March G, March U, Mov-I, Hammer Read Test SPD Program：Write/Read 0 ? 511 SWP, CWP General Specs Power Requirement：110V - 230V AC Operating Temp：-20 to 100 Degrees F Humidity：20% to 80% ( Non-Condensing ) Dimension：235 x 220 x 140 mm ? 10 Pounds Host Computer：Intel / AMD Based ( USB 2.0 & 3.0 ) |
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| Eureka Express DDR3 | |
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Description High Performance System : Auto ID: RDIMM, UDIMM, SODIMM, Auto ID:Memory Configuration, Size Auto ID:Frenquency, Cas Latency Detects:ECC and Non-ECC RDIMM Real Cycle Time Testing Super Fast Test Time Effective Test Algorithum : Quick checks for Assembly faults Up to 27 Test Patterns for Functional test Complete SPD Programming tools Fault Focusing tools to detect bad chips Support Heat Chamber Ease of Use : Interface with Desktop via USB port Window driven graphic system Pictorial aid to Pin-point faulty chip EZ firmware upgrade Support all CST Auto-Handler Support Window XP, VISTA, WIN7 |
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